by Güney, Arda, Yelten, Mustafa Berke, Ferhanoğlu, Onur and Kahraman, Nihan
Reference:
Güney, Arda, Yelten, Mustafa Berke, Ferhanoğlu, Onur and Kahraman, Nihan, "Experimental and modeling studies of automotive-qualified OLEDs under electrical stress", In Microelectronics Reliability, vol. 111, 2020.
Bibtex Entry:
@ARTICLE{Güney2020,
author = {Güney, Arda and Yelten, Mustafa Berke and Ferhanoğlu, Onur and Kahraman, Nihan},
title = {Experimental and modeling studies of automotive-qualified OLEDs under electrical stress},
year = {2020},
journal = {Microelectronics Reliability},
volume = {111},
doi = {10.1016/j.microrel.2020.113704},
url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-85085653124&doi=10.1016%2fj.microrel.2020.113704&partnerID=40&md5=ee9fca50794b231f36db559be837dc02},
language = {English},
type = {Article},
publication_stage = {Final},
source = {Scopus}
}