by Joof, Sulayman, Aydinalp, Cemanur, Yildiz, Gulsah and Akinci, Mehmet Nuri
Reference:
Joof, Sulayman, Aydinalp, Cemanur, Yildiz, Gulsah and Akinci, Mehmet Nuri, "Testing the Multi-Frequency Complex Dielectric Permittivity Estimation with a Low-Cost Pocket Vector Network Analyzer and an Open-Ended Coaxial Probe; [Çok Frekanslı Kompleks Dielektrik Geçirgenlik Tahmininin Düşük Maliyetli Cep Vektör Ağ Analizörü ve Açık Uçlu Koaksiyel Prob ile Test Edilmesi]", 32nd IEEE Conference on Signal Processing and Communications Applications, SIU 2024 - Proceedings, 2024.
Bibtex Entry:
@CONFERENCE{Joof2024,
author = {Joof, Sulayman and Aydinalp, Cemanur and Yildiz, Gulsah and Akinci, Mehmet Nuri},
title = {Testing the Multi-Frequency Complex Dielectric Permittivity Estimation with a Low-Cost Pocket Vector Network Analyzer and an Open-Ended Coaxial Probe; [Çok Frekanslı Kompleks Dielektrik Geçirgenlik Tahmininin Düşük Maliyetli Cep Vektör Ağ Analizörü ve Açık Uçlu Koaksiyel Prob ile Test Edilmesi]},
year = {2024},
journal = {32nd IEEE Conference on Signal Processing and Communications Applications, SIU 2024 - Proceedings},
doi = {10.1109/SIU61531.2024.10601009},
url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-85200892660&doi=10.1109%2fSIU61531.2024.10601009&partnerID=40&md5=0f9048c2367d738fde5c5b9b077e57b7},
language = {English},
type = {Conference paper},
publication_stage = {Final},
source = {Scopus}
}