by Le, Tony, Kurt, Onur, Ouyang, Jun, Wang, Jianjun, Chen, Long-Qing, Lin, Edward L., Ekerdt, John G. and Ren, Yuhang
Reference:
Le, Tony, Kurt, Onur, Ouyang, Jun, Wang, Jianjun, Chen, Long-Qing, Lin, Edward L., Ekerdt, John G. and Ren, Yuhang, "Engineering nanoscale polarization at the SrTiO3/Ge interface", In Scripta Materialia, vol. 178, pp. 489 – 492, 2020.
Bibtex Entry:
@ARTICLE{Le2020489, author = {Le, Tony and Kurt, Onur and Ouyang, Jun and Wang, Jianjun and Chen, Long-Qing and Lin, Edward L. and Ekerdt, John G. and Ren, Yuhang}, title = {Engineering nanoscale polarization at the SrTiO3/Ge interface}, year = {2020}, journal = {Scripta Materialia}, volume = {178}, pages = {489 – 492}, doi = {10.1016/j.scriptamat.2019.12.033}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-85077305975&doi=10.1016%2fj.scriptamat.2019.12.033&partnerID=40&md5=e6e763fcafee49ad5cf45ea44ac5e7f1}, language = {English}, type = {Article}, publication_stage = {Final}, source = {Scopus}, note = {All Open Access, Bronze Open Access} }