by Sefer, Ahmet, Yapar, Ali and Bagci, Hakan
Reference:
Sefer, Ahmet, Yapar, Ali and Bagci, Hakan, "Electromagnetic Imaging of Rough Dielectric Surface Profiles using a Single-Frequency Reverse Time Migration Method", IEEE Antennas and Propagation Society, AP-S International Symposium (Digest), pp. 467 – 468, 2023.
Bibtex Entry:
@CONFERENCE{Sefer2023467,
author = {Sefer, Ahmet and Yapar, Ali and Bagci, Hakan},
title = {Electromagnetic Imaging of Rough Dielectric Surface Profiles using a Single-Frequency Reverse Time Migration Method},
year = {2023},
journal = {IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)},
volume = {2023-July},
pages = {467 – 468},
doi = {10.1109/USNC-URSI52151.2023.10237795},
url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-85172411947&doi=10.1109%2fUSNC-URSI52151.2023.10237795&partnerID=40&md5=771b2dc8563d05fe67c167172c318317},
language = {English},
type = {Conference paper},
publication_stage = {Final},
source = {Scopus}
}