by Xhafa, Xhesila, Gungordu, Ali Dogus, Erol, Didem, Yavuz, Yavuzhan and Yelten, Mustafa Berke
Reference:
Xhafa, Xhesila, Gungordu, Ali Dogus, Erol, Didem, Yavuz, Yavuzhan and Yelten, Mustafa Berke, "An Automated Setup for the Characterization of Time-Based Degradation Effects including the Process Variability in 40-nm CMOS Transistors", In IEEE Transactions on Instrumentation and Measurement, vol. 70, 2021.
Bibtex Entry:
@ARTICLE{Xhafa2021,
author = {Xhafa, Xhesila and Gungordu, Ali Dogus and Erol, Didem and Yavuz, Yavuzhan and Yelten, Mustafa Berke},
title = {An Automated Setup for the Characterization of Time-Based Degradation Effects including the Process Variability in 40-nm CMOS Transistors},
year = {2021},
journal = {IEEE Transactions on Instrumentation and Measurement},
volume = {70},
doi = {10.1109/TIM.2021.3090175},
url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-85110575912&doi=10.1109%2fTIM.2021.3090175&partnerID=40&md5=aeb3e72187f9d3dc4f52ea6bdec5a50e},
language = {English},
type = {Article},
publication_stage = {Final},
source = {Scopus}
}