by Yelten, Mustafa Berke
Reference:
Yelten, Mustafa Berke, "Holistic Device Modeling: Toward a Unified MOSFET Model Including Variability, Aging, and Extreme Operating Conditions", In IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 69, no. 6, pp. 2635 – 2640, 2022.
Bibtex Entry:
@ARTICLE{Yelten20222635,
author = {Yelten, Mustafa Berke},
title = {Holistic Device Modeling: Toward a Unified MOSFET Model Including Variability, Aging, and Extreme Operating Conditions},
year = {2022},
journal = {IEEE Transactions on Circuits and Systems II: Express Briefs},
volume = {69},
number = {6},
pages = {2635 – 2640},
doi = {10.1109/TCSII.2022.3171136},
url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-85129366242&doi=10.1109%2fTCSII.2022.3171136&partnerID=40&md5=85237b20255d57d030b5b774466d13b7},
language = {English},
type = {Article},
publication_stage = {Final},
source = {Scopus}
}