by Afacan, E., Berke Yelten, M. and Dundar, G.
Reference:
Afacan, E., Berke Yelten, M. and Dundar, G., "Review: Analog design methodologies for reliability in nanoscale CMOS circuits", SMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, 2017.
Bibtex Entry:
@CONFERENCE{Afacan2017,
author={Afacan, E. and Berke Yelten, M. and Dundar, G.},
title={Review: Analog design methodologies for reliability in nanoscale CMOS circuits},
journal={SMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design},
year={2017},
doi={10.1109/SMACD.2017.7981608},
art_number={7981608},
url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85027513059&doi=10.1109%2fSMACD.2017.7981608&partnerID=40&md5=0729dd2ff45094bd6c58e7a03845a5ee},
language={English},
document_type={Conference Paper},
source={Scopus},
}