by Güney, A., Yelten, M.B., Ferhanoğlu, O. and Kahraman, N.
Reference:
Güney, A., Yelten, M.B., Ferhanoğlu, O. and Kahraman, N., "Experimental and modeling studies of automotive-qualified OLEDs under electrical stress", In Microelectronics Reliability, vol. 111, 2020.
Bibtex Entry:
@ARTICLE{Güney2020,
author={Güney, A. and Yelten, M.B. and Ferhanoğlu, O. and Kahraman, N.},
title={Experimental and modeling studies of automotive-qualified OLEDs under electrical stress},
journal={Microelectronics Reliability},
year={2020},
volume={111},
doi={10.1016/j.microrel.2020.113704},
art_number={113704},
url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85085653124&doi=10.1016%2fj.microrel.2020.113704&partnerID=40&md5=ee9fca50794b231f36db559be837dc02},
language={English},
document_type={Article},
source={Scopus},
}