by Ilik, S. and Yelten, M.B.
Reference:
Ilik, S. and Yelten, M.B., "Total Ionizing Dose (TID) Impact on Basic Amplifier Stages", In IEEE Transactions on Device and Materials Reliability, vol. 23, no. 1, pp. 51-57, 2023.
Bibtex Entry:
@ARTICLE{Ilik202351,
author={Ilik, S. and Yelten, M.B.},
title={Total Ionizing Dose (TID) Impact on Basic Amplifier Stages},
journal={IEEE Transactions on Device and Materials Reliability},
year={2023},
volume={23},
number={1},
pages={51-57},
doi={10.1109/TDMR.2022.3227766},
url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85144752564&doi=10.1109%2fTDMR.2022.3227766&partnerID=40&md5=c8984bc203ec971a1b4903c86cea0b0c},
language={English},
document_type={Article},
source={Scopus},
}