by Kabaoǧlu, A., Şahin-Solmaz, N., İlik, S., Uzun, Y. and Yelten, M.B.
Reference:
Kabaoǧlu, A., Şahin-Solmaz, N., İlik, S., Uzun, Y. and Yelten, M.B., "Variability-aware cryogenic models of mosfets: Validation and circuit design", In Semiconductor Science and Technology, vol. 34, no. 11, 2019.
Bibtex Entry:
@ARTICLE{Kabaoǧlu2019,
author={Kabaoǧlu, A. and Şahin-Solmaz, N. and İlik, S. and Uzun, Y. and Yelten, M.B.},
title={Variability-aware cryogenic models of mosfets: Validation and circuit design},
journal={Semiconductor Science and Technology},
year={2019},
volume={34},
number={11},
doi={10.1088/1361-6641/ab3ff9},
art_number={115004},
url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85075997381&doi=10.1088%2f1361-6641%2fab3ff9&partnerID=40&md5=abccb6484369b6e1883fb35b87868c41},
language={English},
document_type={Article},
source={Scopus},
}