by Kabaoglu, A., Solmaz, N.S., Ilik, S., Uzun, Y. and Yelten, M.B.
Reference:
Kabaoglu, A., Solmaz, N.S., Ilik, S., Uzun, Y. and Yelten, M.B., "Statistical MOSFET Modeling Methodology for Cryogenic Conditions", In IEEE Transactions on Electron Devices, vol. 66, no. 1, pp. 66-72, 2019.
Bibtex Entry:
@ARTICLE{Kabaoglu201966,
author={Kabaoglu, A. and Solmaz, N.S. and Ilik, S. and Uzun, Y. and Yelten, M.B.},
title={Statistical MOSFET Modeling Methodology for Cryogenic Conditions},
journal={IEEE Transactions on Electron Devices},
year={2019},
volume={66},
number={1},
pages={66-72},
doi={10.1109/TED.2018.2877942},
art_number={8550668},
url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85057808957&doi=10.1109%2fTED.2018.2877942&partnerID=40&md5=ccc2ecea5559acaed85ce5f0cd5eaef1},
language={English},
document_type={Article},
source={Scopus},
}