by Odabaşi, I.Ç., Yelten, M.B., Afacan, E., Baskaya, F., Pusane, A.E. and Dündar, G.
Reference:
Odabaşi, I.Ç., Yelten, M.B., Afacan, E., Baskaya, F., Pusane, A.E. and Dündar, G., "A rare event based yield estimation methodology for analog circuits", Proceedings - 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018, pp. 33-38, 2018.
Bibtex Entry:
@CONFERENCE{Odabaşi201833, author={Odabaşi, I.Ç. and Yelten, M.B. and Afacan, E. and Baskaya, F. and Pusane, A.E. and Dündar, G.}, title={A rare event based yield estimation methodology for analog circuits}, journal={Proceedings - 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018}, year={2018}, pages={33-38}, doi={10.1109/DDECS.2018.00013}, url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85050984435&doi=10.1109%2fDDECS.2018.00013&partnerID=40&md5=c6a65d405d2257f743ca46d9babc80fc}, language={English}, document_type={Conference Paper}, source={Scopus}, }