by Odabaşi, I.Ç., Yelten, M.B., Afacan, E., Baskaya, F., Pusane, A.E. and Dündar, G.
Reference:
Odabaşi, I.Ç., Yelten, M.B., Afacan, E., Baskaya, F., Pusane, A.E. and Dündar, G., "A rare event based yield estimation methodology for analog circuits", Proceedings - 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018, pp. 33-38, 2018.
Bibtex Entry:
@CONFERENCE{Odabaşi201833,
author={Odabaşi, I.Ç. and Yelten, M.B. and Afacan, E. and Baskaya, F. and Pusane, A.E. and Dündar, G.},
title={A rare event based yield estimation methodology for analog circuits},
journal={Proceedings - 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018},
year={2018},
pages={33-38},
doi={10.1109/DDECS.2018.00013},
url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85050984435&doi=10.1109%2fDDECS.2018.00013&partnerID=40&md5=c6a65d405d2257f743ca46d9babc80fc},
language={English},
document_type={Conference Paper},
source={Scopus},
}