by Saniç, M.T. and Yelten, M.B.
Reference:
Saniç, M.T. and Yelten, M.B., "Impact of transistor scaling on the time-dependent dielectric breakdown (TDDB) reliability of analog circuits", 2017 10th International Conference on Electrical and Electronics Engineering, ELECO 2017, pp. 476-480, 2017.
Bibtex Entry:
@CONFERENCE{Saniç2018476,
author={Saniç, M.T. and Yelten, M.B.},
title={Impact of transistor scaling on the time-dependent dielectric breakdown (TDDB) reliability of analog circuits},
journal={2017 10th International Conference on Electrical and Electronics Engineering, ELECO 2017},
year={2017},
volume={2018-January},
pages={476-480},
url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85046265263&partnerID=40&md5=3f3dc37cb351c66be68d562562199f7c},
language={English},
document_type={Conference Paper},
source={Scopus},
}