by Sefer, A. and Yapar, A.
Reference:
Sefer, A. and Yapar, A., "Electromagnetic imaging of random rough surface profiles", 2019 5th International Electromagnetic Compatibility Conference, EMC Turkiye 2019, 2019.
Bibtex Entry:
@CONFERENCE{Sefer2019, author={Sefer, A. and Yapar, A.}, title={Electromagnetic imaging of random rough surface profiles}, journal={2019 5th International Electromagnetic Compatibility Conference, EMC Turkiye 2019}, year={2019}, doi={10.1109/EMCTurkiye45372.2019.8976026}, art_number={8976026}, url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85079348741&doi=10.1109%2fEMCTurkiye45372.2019.8976026&partnerID=40&md5=dd2e65eff3c686d3debaca2367ecfd83}, language={English}, document_type={Conference Paper}, source={Scopus}, }