by Sefer, A., Yapar, A. and Bagci, H.
Reference:
Sefer, A., Yapar, A. and Bagci, H., "Electromagnetic Imaging of Rough Dielectric Surface Profiles using a Single-Frequency Reverse Time Migration Method", IEEE Antennas and Propagation Society, AP-S International Symposium (Digest), pp. 467-468, 2023.
Bibtex Entry:
@CONFERENCE{Sefer2023467,
author={Sefer, A. and Yapar, A. and Bagci, H.},
title={Electromagnetic Imaging of Rough Dielectric Surface Profiles using a Single-Frequency Reverse Time Migration Method},
journal={IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)},
year={2023},
volume={2023-July},
pages={467-468},
doi={10.1109/USNC-URSI52151.2023.10237795},
url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85172411947&doi=10.1109%2fUSNC-URSI52151.2023.10237795&partnerID=40&md5=771b2dc8563d05fe67c167172c318317},
language={English},
document_type={Conference Paper},
source={Scopus},
}