by Tunali, O. and Altun, M.
Reference:
Tunali, O. and Altun, M., "A Fast Logic Mapping Algorithm for Multiple-Type-Defect Tolerance in Reconfigurable Nano-Crossbar Arrays", In IEEE Transactions on Emerging Topics in Computing, vol. 7, no. 4, pp. 518-529, 2019.
Bibtex Entry:
@ARTICLE{Tunali2019518, author={Tunali, O. and Altun, M.}, title={A Fast Logic Mapping Algorithm for Multiple-Type-Defect Tolerance in Reconfigurable Nano-Crossbar Arrays}, journal={IEEE Transactions on Emerging Topics in Computing}, year={2019}, volume={7}, number={4}, pages={518-529}, doi={10.1109/TETC.2017.2755458}, art_number={8047982}, url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85030627074&doi=10.1109%2fTETC.2017.2755458&partnerID=40&md5=cb8fe6440543b1eb4dfccd44a643fc0d}, language={English}, document_type={Article}, source={Scopus}, }