by Xhafa, X., Gungordu, A.D., Erol, D., Yavuz, Y. and Yelten, M.B.
Reference:
Xhafa, X., Gungordu, A.D., Erol, D., Yavuz, Y. and Yelten, M.B., "An Automated Setup for the Characterization of Time-Based Degradation Effects including the Process Variability in 40-nm CMOS Transistors", In IEEE Transactions on Instrumentation and Measurement, vol. 70, 2021.
Bibtex Entry:
@ARTICLE{Xhafa2021,
author={Xhafa, X. and Gungordu, A.D. and Erol, D. and Yavuz, Y. and Yelten, M.B.},
title={An Automated Setup for the Characterization of Time-Based Degradation Effects including the Process Variability in 40-nm CMOS Transistors},
journal={IEEE Transactions on Instrumentation and Measurement},
year={2021},
volume={70},
doi={10.1109/TIM.2021.3090175},
art_number={9458293},
url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85110575912&doi=10.1109%2fTIM.2021.3090175&partnerID=40&md5=aeb3e72187f9d3dc4f52ea6bdec5a50e},
language={English},
document_type={Article},
source={Scopus},
}