by Yelten, M.B.
Reference:
Yelten, M.B., "Holistic Device Modeling: Toward a Unified MOSFET Model Including Variability, Aging, and Extreme Operating Conditions", In IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 69, no. 6, pp. 2635-2640, 2022.
Bibtex Entry:
@ARTICLE{Yelten20222635,
author={Yelten, M.B.},
title={Holistic Device Modeling: Toward a Unified MOSFET Model Including Variability, Aging, and Extreme Operating Conditions},
journal={IEEE Transactions on Circuits and Systems II: Express Briefs},
year={2022},
volume={69},
number={6},
pages={2635-2640},
doi={10.1109/TCSII.2022.3171136},
url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85129366242&doi=10.1109%2fTCSII.2022.3171136&partnerID=40&md5=85237b20255d57d030b5b774466d13b7},
language={English},
document_type={Article},
source={Scopus},
}