by Yildiz, R.O., Tunc, A., Yagc, H.B., Paker, S. and Ceylan, O.
Reference:
Yildiz, R.O., Tunc, A., Yagc, H.B., Paker, S. and Ceylan, O., "Biasing Control and Protection System for GaN HEMT Power Amplifier Measurements", 2020 IEEE MTT-S Latin America Microwave Conference, LAMC 2020, 2020.
Bibtex Entry:
@CONFERENCE{Yildiz2020,
author={Yildiz, R.O. and Tunc, A. and Yagc, H.B. and Paker, S. and Ceylan, O.},
title={Biasing Control and Protection System for GaN HEMT Power Amplifier Measurements},
journal={2020 IEEE MTT-S Latin America Microwave Conference, LAMC 2020},
year={2020},
doi={10.1109/LAMC50424.2021.9601558},
url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85123397531&doi=10.1109%2fLAMC50424.2021.9601558&partnerID=40&md5=647c12ef45e7bce733be178971b432d0},
language={English},
document_type={Conference Paper},
source={Scopus},
}