by Saniç, M.T. and Yelten, M.B.
Reference:
Saniç, M.T. and Yelten, M.B., "Time-dependent dielectric breakdown (TDDB) reliability analysis of CMOS analog and radio frequency (RF) circuits", In Analog Integrated Circuits and Signal Processing, vol. 97, no. 1, pp. 39-47, 2018.
Bibtex Entry:
@ARTICLE{Saniç201839,
author={Saniç, M.T. and Yelten, M.B.},
title={Time-dependent dielectric breakdown (TDDB) reliability analysis of CMOS analog and radio frequency (RF) circuits},
journal={Analog Integrated Circuits and Signal Processing},
year={2018},
volume={97},
number={1},
pages={39-47},
doi={10.1007/s10470-018-1243-0},
url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85049045501&doi=10.1007%2fs10470-018-1243-0&partnerID=40&md5=a81e1a489ebf23e168215e0fd3504eb0},
language={English},
document_type={Article},
source={Scopus},
}